1

Sampling analysis in the dpm range

Year:
1990
Language:
english
File:
PDF, 333 KB
english, 1990
2

Functional burn-in for integrated circuits

Year:
1990
Language:
english
File:
PDF, 406 KB
english, 1990
3

Qualification of integrated circuits

Year:
1986
Language:
english
File:
PDF, 750 KB
english, 1986
4

Phase integral solutions for graded-index fibers

Year:
1985
Language:
english
File:
PDF, 635 KB
english, 1985
7

Tightened Sampling Inspection For Electronic Components

Year:
1990
Language:
english
File:
PDF, 3.08 MB
english, 1990